An Effective Built-In Self-Test for Chargepump PLL

Junseok HAN; Dongsup SONG; Hagbae KIM; YoungYong KIM; Sungho KANG

doi:10.1093/ietele/e88-c.8.1731

An Effective Built-In Self-Test for Chargepump PLL

Junseok HAN, Dongsup SONG, Hagbae KIM, YoungYong KIM, Sungho KANG

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In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.

Publication: IEICE TRANSACTIONS on Electronics Vol.E88-C No.8 pp.1731-1733

Publication Date: 2005/08/01

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DOI: 10.1093/ietele/e88-c.8.1731

Type of Manuscript: Special Section LETTER (Special Section on Papers Selected from AP-ASIC 2004)

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Junseok HAN, Dongsup SONG, Hagbae KIM, YoungYong KIM, Sungho KANG, "An Effective Built-In Self-Test for Chargepump PLL" in IEICE TRANSACTIONS on Electronics, vol. E88-C, no. 8, pp. 1731-1733, August 2005, doi: 10.1093/ietele/e88-c.8.1731.
Abstract: In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.
URL: https://globals.ieice.org/en_transactions/electronics/10.1093/ietele/e88-c.8.1731/_p

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@ARTICLE{e88-c_8_1731,
author={Junseok HAN, Dongsup SONG, Hagbae KIM, YoungYong KIM, Sungho KANG, },
journal={IEICE TRANSACTIONS on Electronics},
title={An Effective Built-In Self-Test for Chargepump PLL},
year={2005},
volume={E88-C},
number={8},
pages={1731-1733},
abstract={In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.},
keywords={},
doi={10.1093/ietele/e88-c.8.1731},
ISSN={},
month={August},}

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TY - JOUR
TI - An Effective Built-In Self-Test for Chargepump PLL
T2 - IEICE TRANSACTIONS on Electronics
SP - 1731
EP - 1733
AU - Junseok HAN
AU - Dongsup SONG
AU - Hagbae KIM
AU - YoungYong KIM
AU - Sungho KANG
PY - 2005
DO - 10.1093/ietele/e88-c.8.1731
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E88-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2005
AB - In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.
ER -