High Power GaN-FET Amplifier with Reduced Memory Effects for W-CDMA Base Stations

Akio WAKEJIMA, Kohji MATSUNAGA, Yuji ANDO, Tatsuo NAKAYAMA, Yasuhiro OKAMOTO, Kazuki OTA, Naotaka KURODA, Masahiro TANOMURA, Hironobu MIYAMOTO

  • Full Text Views

    0

  • Cite this

Summary :

This paper describes a high power GaN-FET amplifier which is developed for wideband code division multiple access (W-CDMA) base stations. We design a bias network which is symmetrically arranged to the RF line (two way bias network) in order to reduce impedance at a baseband frequency of the multi-carrier W-CDMA signal. As a result, the amplifier with the two way bias network successfully suppressed memory effects. Therefore, the application of a DPD technique to the GaN-FET amplifier with the two way bias network demonstrates almost 20 dB linearity improvement in IM3 and considerable improvement in higher order IMD, resulting in low IMD of less than -50 dBc at the highest ever reported W-CDMA average output power of 76 W.

Publication
IEICE TRANSACTIONS on Electronics Vol.E90-C No.5 pp.929-936
Publication Date
2007/05/01
Publicized
Online ISSN
1745-1353
DOI
10.1093/ietele/e90-c.5.929
Type of Manuscript
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category
Compound Semiconductor and Power Devices

Authors

Keyword

FlyerIEICE has prepared a flyer regarding multilingual services. Please use the one in your native language.