In order to achieve 3.3-V 1-Gb DRAM and beyond, this paper proposes a new on-chip supply voltage conversion scheme, which converts 3.3-V external supply voltage Vext to lowered 1.5-V internal supply voltage Vint without any power loss within the voltage converter. This scheme connects two identical DRAM circuits in series between Vext and Vss. By operations of two DRAM circuits with the same clock timing, the voltage between two DRAM's, Vint, is automatically fixed to 1/2Vext. Therefore, each upper and lower DRAM circuit can operate at lowered 1/2Vext without use of the conventional voltage converter. This scheme was successfully verified by an experimental system using 4-Mb DRAM's. Utilizing the proposed scheme, power dissipation was reduced by as much as 50% and stable operation was achieved without access speed penalty.
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Daisaburo TAKASHIMA, Shigeyoshi WATANABE, Tsuneaki FUSE, Kazumasa SUNOUCHI, Takahiko HARA, "Low-Power On-Chip Supply Voltage Conversion Scheme for Ultrahigh-Density DRAM's" in IEICE TRANSACTIONS on Electronics,
vol. E76-C, no. 5, pp. 844-849, May 1993, doi: .
Abstract: In order to achieve 3.3-V 1-Gb DRAM and beyond, this paper proposes a new on-chip supply voltage conversion scheme, which converts 3.3-V external supply voltage Vext to lowered 1.5-V internal supply voltage Vint without any power loss within the voltage converter. This scheme connects two identical DRAM circuits in series between Vext and Vss. By operations of two DRAM circuits with the same clock timing, the voltage between two DRAM's, Vint, is automatically fixed to 1/2Vext. Therefore, each upper and lower DRAM circuit can operate at lowered 1/2Vext without use of the conventional voltage converter. This scheme was successfully verified by an experimental system using 4-Mb DRAM's. Utilizing the proposed scheme, power dissipation was reduced by as much as 50% and stable operation was achieved without access speed penalty.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/e76-c_5_844/_p
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@ARTICLE{e76-c_5_844,
author={Daisaburo TAKASHIMA, Shigeyoshi WATANABE, Tsuneaki FUSE, Kazumasa SUNOUCHI, Takahiko HARA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Low-Power On-Chip Supply Voltage Conversion Scheme for Ultrahigh-Density DRAM's},
year={1993},
volume={E76-C},
number={5},
pages={844-849},
abstract={In order to achieve 3.3-V 1-Gb DRAM and beyond, this paper proposes a new on-chip supply voltage conversion scheme, which converts 3.3-V external supply voltage Vext to lowered 1.5-V internal supply voltage Vint without any power loss within the voltage converter. This scheme connects two identical DRAM circuits in series between Vext and Vss. By operations of two DRAM circuits with the same clock timing, the voltage between two DRAM's, Vint, is automatically fixed to 1/2Vext. Therefore, each upper and lower DRAM circuit can operate at lowered 1/2Vext without use of the conventional voltage converter. This scheme was successfully verified by an experimental system using 4-Mb DRAM's. Utilizing the proposed scheme, power dissipation was reduced by as much as 50% and stable operation was achieved without access speed penalty.},
keywords={},
doi={},
ISSN={},
month={May},}
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TY - JOUR
TI - Low-Power On-Chip Supply Voltage Conversion Scheme for Ultrahigh-Density DRAM's
T2 - IEICE TRANSACTIONS on Electronics
SP - 844
EP - 849
AU - Daisaburo TAKASHIMA
AU - Shigeyoshi WATANABE
AU - Tsuneaki FUSE
AU - Kazumasa SUNOUCHI
AU - Takahiko HARA
PY - 1993
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E76-C
IS - 5
JA - IEICE TRANSACTIONS on Electronics
Y1 - May 1993
AB - In order to achieve 3.3-V 1-Gb DRAM and beyond, this paper proposes a new on-chip supply voltage conversion scheme, which converts 3.3-V external supply voltage Vext to lowered 1.5-V internal supply voltage Vint without any power loss within the voltage converter. This scheme connects two identical DRAM circuits in series between Vext and Vss. By operations of two DRAM circuits with the same clock timing, the voltage between two DRAM's, Vint, is automatically fixed to 1/2Vext. Therefore, each upper and lower DRAM circuit can operate at lowered 1/2Vext without use of the conventional voltage converter. This scheme was successfully verified by an experimental system using 4-Mb DRAM's. Utilizing the proposed scheme, power dissipation was reduced by as much as 50% and stable operation was achieved without access speed penalty.
ER -