Analysis of High Power Amplifier Instability due to <I>f</I><SUB>0</SUB>/2 Loop Oscillation

Tadashi TAKAGI; Mitsuru MOCHIZUKI; Yukinobu TARUI; Yasushi ITOH; Seiichi TSUJI; Yasuo MITSUI

Analysis of High Power Amplifier Instability due to f₀/2 Loop Oscillation

Tadashi TAKAGI, Mitsuru MOCHIZUKI, Yukinobu TARUI, Yasushi ITOH, Seiichi TSUJI, Yasuo MITSUI

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A novel nonlinear analysis method of high power amplifier instability has been developed. This analysis method deals with a loop oscillation in a closed loop circuit and presents the conditions for oscillation under large-signal operation by taking account of mixing effect of FETs. Applying this analysis to the high power amplifier instability that an output power for the fundamental wave (f₀-wave) decreases at some compression point where a half of the fundamental wave (f₀/2-wave) is observed, it has been found that this instability is caused by an f₀/2 loop oscillation. In addition, it has been verified by analysis and experiment that the oscillation can be removed by employing an isolation resistor in a closed loop circuit.

Publication: IEICE TRANSACTIONS on Electronics Vol.E78-C No.8 pp.936-943

Publication Date: 1995/08/25

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Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology)

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Tadashi TAKAGI, Mitsuru MOCHIZUKI, Yukinobu TARUI, Yasushi ITOH, Seiichi TSUJI, Yasuo MITSUI, "Analysis of High Power Amplifier Instability due to f0/2 Loop Oscillation" in IEICE TRANSACTIONS on Electronics, vol. E78-C, no. 8, pp. 936-943, August 1995, doi: .
Abstract: A novel nonlinear analysis method of high power amplifier instability has been developed. This analysis method deals with a loop oscillation in a closed loop circuit and presents the conditions for oscillation under large-signal operation by taking account of mixing effect of FETs. Applying this analysis to the high power amplifier instability that an output power for the fundamental wave (f₀-wave) decreases at some compression point where a half of the fundamental wave (f₀/2-wave) is observed, it has been found that this instability is caused by an f₀/2 loop oscillation. In addition, it has been verified by analysis and experiment that the oscillation can be removed by employing an isolation resistor in a closed loop circuit.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/e78-c_8_936/_p

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@ARTICLE{e78-c_8_936,
author={Tadashi TAKAGI, Mitsuru MOCHIZUKI, Yukinobu TARUI, Yasushi ITOH, Seiichi TSUJI, Yasuo MITSUI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Analysis of High Power Amplifier Instability due to f0/2 Loop Oscillation},
year={1995},
volume={E78-C},
number={8},
pages={936-943},
abstract={A novel nonlinear analysis method of high power amplifier instability has been developed. This analysis method deals with a loop oscillation in a closed loop circuit and presents the conditions for oscillation under large-signal operation by taking account of mixing effect of FETs. Applying this analysis to the high power amplifier instability that an output power for the fundamental wave (f₀-wave) decreases at some compression point where a half of the fundamental wave (f₀/2-wave) is observed, it has been found that this instability is caused by an f₀/2 loop oscillation. In addition, it has been verified by analysis and experiment that the oscillation can be removed by employing an isolation resistor in a closed loop circuit.},
keywords={},
doi={},
ISSN={},
month={August},}

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TY - JOUR
TI - Analysis of High Power Amplifier Instability due to f0/2 Loop Oscillation
T2 - IEICE TRANSACTIONS on Electronics
SP - 936
EP - 943
AU - Tadashi TAKAGI
AU - Mitsuru MOCHIZUKI
AU - Yukinobu TARUI
AU - Yasushi ITOH
AU - Seiichi TSUJI
AU - Yasuo MITSUI
PY - 1995
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E78-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 1995
AB - A novel nonlinear analysis method of high power amplifier instability has been developed. This analysis method deals with a loop oscillation in a closed loop circuit and presents the conditions for oscillation under large-signal operation by taking account of mixing effect of FETs. Applying this analysis to the high power amplifier instability that an output power for the fundamental wave (f₀-wave) decreases at some compression point where a half of the fundamental wave (f₀/2-wave) is observed, it has been found that this instability is caused by an f₀/2 loop oscillation. In addition, it has been verified by analysis and experiment that the oscillation can be removed by employing an isolation resistor in a closed loop circuit.
ER -