Built-In Self-Test for Static ADC Testing with a Triangle-Wave

Incheol KIM; Ingeol LEE; Sungho KANG

doi:10.1587/transele.E96.C.292

Built-In Self-Test for Static ADC Testing with a Triangle-Wave

Incheol KIM, Ingeol LEE, Sungho KANG

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This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.

Publication: IEICE TRANSACTIONS on Electronics Vol.E96-C No.2 pp.292-294

Publication Date: 2013/02/01

Publicized

Online ISSN: 1745-1353

DOI: 10.1587/transele.E96.C.292

Type of Manuscript: BRIEF PAPER

Category: Integrated Electronics

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Incheol KIM, Ingeol LEE, Sungho KANG, "Built-In Self-Test for Static ADC Testing with a Triangle-Wave" in IEICE TRANSACTIONS on Electronics, vol. E96-C, no. 2, pp. 292-294, February 2013, doi: 10.1587/transele.E96.C.292.
Abstract: This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.
URL: https://globals.ieice.org/en_transactions/electronics/10.1587/transele.E96.C.292/_p

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@ARTICLE{e96-c_2_292,
author={Incheol KIM, Ingeol LEE, Sungho KANG, },
journal={IEICE TRANSACTIONS on Electronics},
title={Built-In Self-Test for Static ADC Testing with a Triangle-Wave},
year={2013},
volume={E96-C},
number={2},
pages={292-294},
abstract={This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.},
keywords={},
doi={10.1587/transele.E96.C.292},
ISSN={1745-1353},
month={February},}

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TY - JOUR
TI - Built-In Self-Test for Static ADC Testing with a Triangle-Wave
T2 - IEICE TRANSACTIONS on Electronics
SP - 292
EP - 294
AU - Incheol KIM
AU - Ingeol LEE
AU - Sungho KANG
PY - 2013
DO - 10.1587/transele.E96.C.292
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E96-C
IS - 2
JA - IEICE TRANSACTIONS on Electronics
Y1 - February 2013
AB - This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC's static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead.
ER -