An Analysis on a Dynamic Amplifier and Calibration Methods for a Pseudo-Differential Dynamic Comparator

Daehwa PAIK; Masaya MIYAHARA; Akira MATSUZAWA

doi:10.1587/transfun.E95.A.456

An Analysis on a Dynamic Amplifier and Calibration Methods for a Pseudo-Differential Dynamic Comparator

Daehwa PAIK, Masaya MIYAHARA, Akira MATSUZAWA

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This paper analyzes a pseudo-differential dynamic comparator with a dynamic pre-amplifier. The transient gain of a dynamic pre-amplifier is derived and applied to equations of the thermal noise and the regeneration time of a comparator. This analysis enhances understanding of the roles of transistor's parameters in pre-amplifier's gain. Based on the calculated gain, two calibration methods are also analyzed. One is calibration of a load capacitance and the other is calibration of a bypass current. The analysis helps designers' estimation for the accuracy of calibration, dead-zone of a comparator with a calibration circuit, and the influence of PVT variation. The analyzed comparator uses 90-nm CMOS technology as an example and each estimation is compared with simulation results.

Publication: IEICE TRANSACTIONS on Fundamentals Vol.E95-A No.2 pp.456-470

Publication Date: 2012/02/01

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Online ISSN: 1745-1337

DOI: 10.1587/transfun.E95.A.456

Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)

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Daehwa PAIK, Masaya MIYAHARA, Akira MATSUZAWA, "An Analysis on a Dynamic Amplifier and Calibration Methods for a Pseudo-Differential Dynamic Comparator" in IEICE TRANSACTIONS on Fundamentals, vol. E95-A, no. 2, pp. 456-470, February 2012, doi: 10.1587/transfun.E95.A.456.
Abstract: This paper analyzes a pseudo-differential dynamic comparator with a dynamic pre-amplifier. The transient gain of a dynamic pre-amplifier is derived and applied to equations of the thermal noise and the regeneration time of a comparator. This analysis enhances understanding of the roles of transistor's parameters in pre-amplifier's gain. Based on the calculated gain, two calibration methods are also analyzed. One is calibration of a load capacitance and the other is calibration of a bypass current. The analysis helps designers' estimation for the accuracy of calibration, dead-zone of a comparator with a calibration circuit, and the influence of PVT variation. The analyzed comparator uses 90-nm CMOS technology as an example and each estimation is compared with simulation results.
URL: https://globals.ieice.org/en_transactions/fundamentals/10.1587/transfun.E95.A.456/_p

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@ARTICLE{e95-a_2_456,
author={Daehwa PAIK, Masaya MIYAHARA, Akira MATSUZAWA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={An Analysis on a Dynamic Amplifier and Calibration Methods for a Pseudo-Differential Dynamic Comparator},
year={2012},
volume={E95-A},
number={2},
pages={456-470},
abstract={This paper analyzes a pseudo-differential dynamic comparator with a dynamic pre-amplifier. The transient gain of a dynamic pre-amplifier is derived and applied to equations of the thermal noise and the regeneration time of a comparator. This analysis enhances understanding of the roles of transistor's parameters in pre-amplifier's gain. Based on the calculated gain, two calibration methods are also analyzed. One is calibration of a load capacitance and the other is calibration of a bypass current. The analysis helps designers' estimation for the accuracy of calibration, dead-zone of a comparator with a calibration circuit, and the influence of PVT variation. The analyzed comparator uses 90-nm CMOS technology as an example and each estimation is compared with simulation results.},
keywords={},
doi={10.1587/transfun.E95.A.456},
ISSN={1745-1337},
month={February},}

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TY - JOUR
TI - An Analysis on a Dynamic Amplifier and Calibration Methods for a Pseudo-Differential Dynamic Comparator
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 456
EP - 470
AU - Daehwa PAIK
AU - Masaya MIYAHARA
AU - Akira MATSUZAWA
PY - 2012
DO - 10.1587/transfun.E95.A.456
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E95-A
IS - 2
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - February 2012
AB - This paper analyzes a pseudo-differential dynamic comparator with a dynamic pre-amplifier. The transient gain of a dynamic pre-amplifier is derived and applied to equations of the thermal noise and the regeneration time of a comparator. This analysis enhances understanding of the roles of transistor's parameters in pre-amplifier's gain. Based on the calculated gain, two calibration methods are also analyzed. One is calibration of a load capacitance and the other is calibration of a bypass current. The analysis helps designers' estimation for the accuracy of calibration, dead-zone of a comparator with a calibration circuit, and the influence of PVT variation. The analyzed comparator uses 90-nm CMOS technology as an example and each estimation is compared with simulation results.
ER -