A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets

Dong-Sup SONG; Sungho KANG

doi:10.1093/ietisy/e89-d.1.354

A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets

Dong-Sup SONG, Sungho KANG

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In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work.

Publication: IEICE TRANSACTIONS on Information Vol.E89-D No.1 pp.354-357

Publication Date: 2006/01/01

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Online ISSN: 1745-1361

DOI: 10.1093/ietisy/e89-d.1.354

Type of Manuscript: LETTER

Category: Dependable Computing

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Dong-Sup SONG, Sungho KANG, "A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets" in IEICE TRANSACTIONS on Information, vol. E89-D, no. 1, pp. 354-357, January 2006, doi: 10.1093/ietisy/e89-d.1.354.
Abstract: In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work.
URL: https://globals.ieice.org/en_transactions/information/10.1093/ietisy/e89-d.1.354/_p

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@ARTICLE{e89-d_1_354,
author={Dong-Sup SONG, Sungho KANG, },
journal={IEICE TRANSACTIONS on Information},
title={A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets},
year={2006},
volume={E89-D},
number={1},
pages={354-357},
abstract={In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work.},
keywords={},
doi={10.1093/ietisy/e89-d.1.354},
ISSN={1745-1361},
month={January},}

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TY - JOUR
TI - A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets
T2 - IEICE TRANSACTIONS on Information
SP - 354
EP - 357
AU - Dong-Sup SONG
AU - Sungho KANG
PY - 2006
DO - 10.1093/ietisy/e89-d.1.354
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E89-D
IS - 1
JA - IEICE TRANSACTIONS on Information
Y1 - January 2006
AB - In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work.
ER -