In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work.

We present a new technique for hierarchical intellectual property (IP) protection using partially-mergeable cores. The proposed core partitioning technique guarantees 100% protection of critical-IP, while simplifying test generation for the logic that is merged with the system. Since critical-IP is tested using BIST, the controllability and observability of internal lines in the core are enhanced, and test application time is reduced. Case studies using the ISIT-DLX and Picojava processor cores demonstrate the applicability of our technique.