CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

Hiroyuki MICHINISHI; Tokumi YOKOHIRA; Takuji OKAMOTO; Toshifumi KOBAYASHI; Tsutomu HONDO

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component

Hiroyuki MICHINISHI, Tokumi YOKOHIRA, Takuji OKAMOTO, Toshifumi KOBAYASHI, Tsutomu HONDO

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This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.

Publication: IEICE TRANSACTIONS on Information Vol.E87-D No.3 pp.551-556

Publication Date: 2004/03/01

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Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI)

Category: Fault Detection

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Hiroyuki MICHINISHI, Tokumi YOKOHIRA, Takuji OKAMOTO, Toshifumi KOBAYASHI, Tsutomu HONDO, "CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component" in IEICE TRANSACTIONS on Information, vol. E87-D, no. 3, pp. 551-556, March 2004, doi: .
Abstract: This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.
URL: https://globals.ieice.org/en_transactions/information/10.1587/e87-d_3_551/_p

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@ARTICLE{e87-d_3_551,
author={Hiroyuki MICHINISHI, Tokumi YOKOHIRA, Takuji OKAMOTO, Toshifumi KOBAYASHI, Tsutomu HONDO, },
journal={IEICE TRANSACTIONS on Information},
title={CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component},
year={2004},
volume={E87-D},
number={3},
pages={551-556},
abstract={This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.},
keywords={},
doi={},
ISSN={},
month={March},}

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TY - JOUR
TI - CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component
T2 - IEICE TRANSACTIONS on Information
SP - 551
EP - 556
AU - Hiroyuki MICHINISHI
AU - Tokumi YOKOHIRA
AU - Takuji OKAMOTO
AU - Toshifumi KOBAYASHI
AU - Tsutomu HONDO
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E87-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2004
AB - This paper proposes a new supply current test method for detecting floating gate defects in CMOS ICs. In the method, unusual increase of the supply current caused by defects is promoted by superposing an AC component on the DC power supply. Feasibility of the test is examined by some experiments on four DUTs with an intentionally caused defect. The results showed that our method could detect clearly all the defects, one of which may be detected by neither any functional logic test nor any conventional supply current test.
ER -