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[Author] Hideyuki WAKADA(2hit)

1-2hit
  • A Built-In Self-Test for ADC and DAC in a Single-Chip Speech CODEC

    Eiichi TERAOKA  Toru KENGAKU  Ikuo YASUI  Kazuyuki ISHIKAWA  Takahiro MATSUO  Hideyuki WAKADA  Narumi SAKASHITA  Yukihiko SHIMAZU  Takeshi TOKUDA  

     
    PAPER

      Vol:
    E80-A No:2
      Page(s):
    339-345

    Built-in self-test (BIST) has been applied to test an analog to digital converter (ADC) and a digital to analog converter (DAC) embedded in a DSP-core ASIC. The eight performance characteristics of the ADC and the DAC designed in accordance with the ITU-T recommendations are measured using the BIST. Three of the eight characteristics - the attenuation/frequency distortion, the variation of gain with input level, and the signal-to-total distortion - have been evaluated and the measured results have shown good agreement with measured results by conventional tests. In the BIST operation, the DSP-core generates input stimulus and analyzes output response by control of the self-test program, The sizes of the self-test program and coefficient data are 822 words of the IROM and 384 words of the data ROM, respectively. This area overhead is less than 0.5% of total chip area. Test-time by the BIST is reduced to approximately 3.2 seconds, which is one-tenth that of conventional testing. The mixed-signal DSP-core ASIC is testable with only logic test equipment, and as a result, test-cost - that is test investment and test-time - is reduced compared with conventional test methods.

  • 2.4-GHz-Band CMOS RF Front-End Building Blocks at a 1.8-V Supply

    Hiroshi KOMURASAKI  Kazuya YAMAMOTO  Hideyuki WAKADA  Tetsuya HEIMA  Akihiko FURUKAWA  Hisayasu SATO  Takahiro MIKI  Naoyuki KATO  Akira HYOGO  Keitaro SEKINE  

     
    PAPER

      Vol:
    E85-A No:2
      Page(s):
    300-308

    This paper describes 2.4-GHz-band front-end building circuits--a down conversion mixer (DCM), a dual-modulus divide-by-4/5 prescaler, a transmit/receive antenna switch (SW), a power amplifier (PA), and a low noise amplifier (LNA). They are fabricated using a standard bulk 0.18 µm CMOS process with a lower current consumption than bipolar circuits, and can operate at the low supply voltage of 1.8 V. Meshed-shielded pads are adopted for lower receiver circuit noise. Pads shielded by metals become cracked when they are bounded, therefore silicided active areas are used as shields instead of metals to avoid these cracks. The meshed shields achieve lower parasitic pad capacitors without parasitic resistors, and also act as dummy active areas. The proposed DCM has a high IP3 characteristic. The DCM has a cascode FET configuration and LO power is injected into the lower FET. By keeping the drain-source voltage of the upper transistor large, the nonlinearity of the drain-source transconductance is reduced and a low distortion DCM is realized. It achieves a higher input referred IP3 with a higher conversion gain for almost the same current consumption of a conventional single-balanced mixer. The output referred IP3 is higher 5.0 dB than the single-balanced mixer. The proposed dual-modulus prescaler employs a fully-differential technique to achieve stable operation. In order to avoid errors, the fully-differential circuit gives the logic voltage swing margins. In addition, the differential technique also reduces the noise effect from the supply voltage line because of the common-mode signal rejection. The maximum operating frequency is 3.0 GHz, and the one flip-flop power consumption normalized by the maximum operating frequency is 180 µW/GHz.

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