A 7bit 1GS/s flash ADC using two bit active interpolation and background offset calibration is proposed and tested. It achieves background calibration using 36 pre-amplifiers with 139 comparators. To cancel the offset, two pre-amplifiers and 12 comparators are set to offline in turn while the others are operating. A two bit active interpolation design and an offset cancellation scheme are implemented in the latch stage. The interpolation and background calibration significantly reduce analog input signal as well as reference voltage load. Fabricated with the 90nm CMOS process, the proposed ADC consumes 95mW under a 1.2V power supply.

A digital background calibration technique using signal-dependent dithering is proposed, to correct the nonlinear errors which results from capacitor mismatches and finite opamp gain in pipelined analog-to-digital converter (ADC). Large magnitude dithers are used to measure and correct both errors simultaneously in background. In the proposed calibration system, the 2.5-bit capacitor-flip-over multiplying digital-to-analog converter (MDAC) stage is modified for the injection of large magnitude dithering by adding six additional comparators, and thus only three correction parameters in every stage subjected to correction were measured and extracted by a simple calibration algorithm with multibit first stage. Behavioral simulation results show that, using the proposed calibration technique, the signal-to-noise-and-distortion ratio improves from 63.3 to 79.3dB and the spurious-free dynamic range is increased from 63.9 to 96.4dB after calibrating the first two stages, in a 14-bit 100-MS/s pipelined ADC with σ=0.2% capacitor mismatches and 60dB nonideal opamp gain. The time of calibrating the first two stages is around 1.34 seconds for the modeled ADC.

The performance of successive approximation register (SAR) analog-to-digital converter (ADC) is well balanced between power and speed compare to the conventional flash or pipeline architecture. The nonlinearities suffer from the CDAC mismatch and comparator offset degrades SAR ADC performance in terms of DNL and INL. An on chip histogram-based digitally assisted background calibration technique is proposed to cancel and relax the aforesaid nonlinearities. The calibration is performed using the input signal, watching the digital codes in the specified vicinity of the decision boundaries, and feeding back to control the compensation capacitor periodically. The calibration does not require special calibration signal or additional analog hardware which is simple and amenable to hardware or software implementations. A 9-bit SAR ADC with split CDAC has been implemented in a 65 nm CMOS technology and it achieves a peak SNDR of 50.81 dB and consumes 1.34 mW from a 1.2-V supply. +0.4/-0.4 LSB DNL and +0.5/-0.7 LSB INL are achieved after calibration. The ADC has input capacitance of 180 fF and occupies an area of 0.10.13 mm2.

This paper describes a flash ADC using interpolation (IP) and cyclic background self-calibrating techniques. The proposed IP technique that is cascade of capacitor IP and gate IP with dynamic double-tail latched comparator reduces non-linearity, power consumption, and occupied area. The cyclic background self-calibrating technique periodically suppresses offset mismatch voltages caused by static fluctuation and dynamic fluctuation due to temperature and supply voltage changes. The ADC has been fabricated in 90-nm 1P10M CMOS technology. Experimental results show that the ADC achieves SNDR of 6.07 bits without calibration and 6.74 bits with calibration up to 500 MHz input signal at sampling rate of 600 MSps. It dissipates 98.5 mW on 1.2-V supply. FoM is 1.54 pJ/conv.

This paper reviews techniques for digitally assisted pipeline ADCs. Errors of pipeline ADCs originated by capacitor mismatch, finite amplifier gain, incomplete settling and offset can be corrected in digital-domain foreground or background calibrations. In foreground calibrations, the errors are measured by reconfiguration of the building blocks of pipeline ADC or using an INL plot without reconfiguration. In background calibrations, the errors are measured with random signal and continuously corrected while simultaneously performing the normal A/D conversions. Techniques for measuring and correcting the errors at foreground and background are reviewed and a unified approach to the description of the principle of background calibration of gain errors is presented.