This paper presents fingerprint image enhancement and rotation schemes that improve the identification accuracy with the pixel-parallel processing of pixels. In the schemes, the range of the fingerprint sensor is adjusted to the finger state, the captured image is retouched to obtain the suitable image for identification, and the image is rotated to the correct angle on the pixel array. Sensor and pixel circuits that provide these operations were devised and a test chip was fabricated using 0.25-µm CMOS and the sensor process. It was confirmed in 150,000 identification tests that the schemes reduce the false rejection rate to 6.17% from 30.59%, when the false acceptance rate is 0.1%.
Satoshi SHIGEMATSU
Koji FUJII
Hiroki MORIMURA
Takahiro HATANO
Mamoru NAKANISHI
Namiko IKEDA
Toshishige SHIMAMURA
Katsuyuki MACHIDA
Yukio OKAZAKI
Hakaru KYURAGI
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Satoshi SHIGEMATSU, Koji FUJII, Hiroki MORIMURA, Takahiro HATANO, Mamoru NAKANISHI, Namiko IKEDA, Toshishige SHIMAMURA, Katsuyuki MACHIDA, Yukio OKAZAKI, Hakaru KYURAGI, "Fingerprint Image Enhancement and Rotation Schemes for a Single-Chip Fingerprint Sensor and Identifier" in IEICE TRANSACTIONS on Electronics,
vol. E89-C, no. 4, pp. 540-550, April 2006, doi: 10.1093/ietele/e89-c.4.540.
Abstract: This paper presents fingerprint image enhancement and rotation schemes that improve the identification accuracy with the pixel-parallel processing of pixels. In the schemes, the range of the fingerprint sensor is adjusted to the finger state, the captured image is retouched to obtain the suitable image for identification, and the image is rotated to the correct angle on the pixel array. Sensor and pixel circuits that provide these operations were devised and a test chip was fabricated using 0.25-µm CMOS and the sensor process. It was confirmed in 150,000 identification tests that the schemes reduce the false rejection rate to 6.17% from 30.59%, when the false acceptance rate is 0.1%.
URL: https://globals.ieice.org/en_transactions/electronics/10.1093/ietele/e89-c.4.540/_p
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@ARTICLE{e89-c_4_540,
author={Satoshi SHIGEMATSU, Koji FUJII, Hiroki MORIMURA, Takahiro HATANO, Mamoru NAKANISHI, Namiko IKEDA, Toshishige SHIMAMURA, Katsuyuki MACHIDA, Yukio OKAZAKI, Hakaru KYURAGI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Fingerprint Image Enhancement and Rotation Schemes for a Single-Chip Fingerprint Sensor and Identifier},
year={2006},
volume={E89-C},
number={4},
pages={540-550},
abstract={This paper presents fingerprint image enhancement and rotation schemes that improve the identification accuracy with the pixel-parallel processing of pixels. In the schemes, the range of the fingerprint sensor is adjusted to the finger state, the captured image is retouched to obtain the suitable image for identification, and the image is rotated to the correct angle on the pixel array. Sensor and pixel circuits that provide these operations were devised and a test chip was fabricated using 0.25-µm CMOS and the sensor process. It was confirmed in 150,000 identification tests that the schemes reduce the false rejection rate to 6.17% from 30.59%, when the false acceptance rate is 0.1%.},
keywords={},
doi={10.1093/ietele/e89-c.4.540},
ISSN={1745-1353},
month={April},}
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TY - JOUR
TI - Fingerprint Image Enhancement and Rotation Schemes for a Single-Chip Fingerprint Sensor and Identifier
T2 - IEICE TRANSACTIONS on Electronics
SP - 540
EP - 550
AU - Satoshi SHIGEMATSU
AU - Koji FUJII
AU - Hiroki MORIMURA
AU - Takahiro HATANO
AU - Mamoru NAKANISHI
AU - Namiko IKEDA
AU - Toshishige SHIMAMURA
AU - Katsuyuki MACHIDA
AU - Yukio OKAZAKI
AU - Hakaru KYURAGI
PY - 2006
DO - 10.1093/ietele/e89-c.4.540
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E89-C
IS - 4
JA - IEICE TRANSACTIONS on Electronics
Y1 - April 2006
AB - This paper presents fingerprint image enhancement and rotation schemes that improve the identification accuracy with the pixel-parallel processing of pixels. In the schemes, the range of the fingerprint sensor is adjusted to the finger state, the captured image is retouched to obtain the suitable image for identification, and the image is rotated to the correct angle on the pixel array. Sensor and pixel circuits that provide these operations were devised and a test chip was fabricated using 0.25-µm CMOS and the sensor process. It was confirmed in 150,000 identification tests that the schemes reduce the false rejection rate to 6.17% from 30.59%, when the false acceptance rate is 0.1%.
ER -