C-C successive approximation register analog-to-digital converter (C-C SAR-ADC) is space-saving architecture compared to SAR-ADC with binary weighted capacitive digital-to-analog converter (CDAC). However, the accuracy of C-C SAR-ADC is degraded due to parasitic capacitance of floating nodes. This paper proposes an algorithm calibrating the non-linearity by γ-estimation to accurately estimate radix greater than 2 required to realize C-C SAR-ADC. Behavioral analyses show that the radix γ-estimation error become within 1.5, 0.4 and 0.1% in case of 8-, 10- and 12-bit resolution ADC, respectively. SPICE simulations show that the γ-estimation satisfies the requirement of 10-bit resolution C-C SAR-ADC. The C-C SAR-ADC using γ-estimation achieves 9.72bit of ENOB, 0.8/-0.5LSB and 0.5/-0.4LSB of DNL/INL.

This paper proposes a low power single-ended successive approximation register (SAR) analog-to-digital converter (ADC) to replace the only analog active circuit, the comparator, with a digital circuit, which is an inverter-based comparator. The replacement helps possible design automation. The inverter threshold voltage variation impact is minimal because an SAR ADC has only one comparator, and many applications are either insensitive to the resulting ADC offset or easily corrected digitally. The proposed resetting approach mitigates leakage when the input is close to the threshold voltage. As an intrinsic headroom-free, and thus low-rail-voltage, friendly structure, an inverter-based comparator also occupies a small area. Furthermore, an 11-bit ADC was designed and manufactured through a 0.35-µm CMOS process by adopting a low-power switching procedure. The ADC achieves an FOM of 181fJ/Conv.-step at a 25kS/s sampling rate when the supply voltage VDD is 1.2V.

A 10-bit 20-MS/s asynchronous SAR ADC with a meta-stability detector using replica comparators is proposed. The proposed SAR ADC with the area of 0.093mm2 is implemented using a 130-nm CMOS process with a 1.2-V supply. The measured peak ENOBs for the full rail-to-rail differential input signal is 9.6bits.

A high energy-efficiency and area-reduction switching scheme for a low-power successive approximation register (SAR) analog-to-digital converter (ADC) is presented. Based on the sequence initialization, monotonic capacitor switching procedure and multiple reference voltages, the average switching energy and total capacitance of the proposed scheme are reduced by 99.4% and 87.5% respectively, compared to the conventional architecture.

In this paper, a 1.8-V 10-bit 100,MS/s successive approximation register (SAR) analog-to-digital converter (ADC) simulated in a TSMC 0.18-$mu$m CMOS process is presented. By applying ten comparators followed by an asynchronous trigger logic, the proposed SAR ADC achieves high speed operation. Compared to the conventional SAR ADC, there is no significant delay in the digital feedback logic in this design. With the sampling rate limited only by the ten delays of the capacitor DAC settling and comparators quantization, the proposed SAR ADC achieves a peak SNDR of 61.2,dB at 100,MS/s and 80,MS/s, consuming 3.2,mW and 3.1,mW respectively.

In this paper, we describe a new method to deal with analog signal in time domain. The method converts voltage signal to time-interleaved phase modulation signal of clock edge. After being amplified by a new time amplifier (TA), phases of the signal are converted to digital codes by successive approximation time-to-digital converter (SA-TDC). The test chip includes 8 interleaved 4 bit SA-TDCs with short latency. The chip operates up to 4.4 GHz. The measured ENOB is 3.51 bit and FOM is 0.49 pJ/conv.

An 8-bit 100-kS/s successive approximation (SA) analog-to-digital converter (ADC) is proposed for measuring EEG and MEG signals in an 88 point. The architectures of a SA ADC with a single-ended analog input and a split-capacitor-based digital-to-analog converter (SC-DAC) are used to reduce the power consumption and chip area of the entire ADC. The proposed SA ADC uses a time-domain comparator that has an input offset self-calibration circuit. It also includes a serial output interface to support a daisy channel that reduces the number of channels for the multi-point sensor interface. It is designed by using a 0.35-µm 1-poly 6-metal CMOS process with a 3.3 V supply to implement together with a conventional analog circuit such as a low-noise-amplifier. The measured DNL and INL of the SA ADC are +0.63/-0.46 and +0.46/-0.51 LSB, respectively. The SNDR is 48.39 dB for a 1.11 kHz analog input signal at a sampling rate of 100 kS/s. The power consumption and core area are 38.71 µW and 0.059 mm2, respectively.

This paper presents a wide range in supply voltage, resolution, and sampling rate asynchronous successive approximation register (SAR) analog-to-digital converter (ADC). The proposed differential flip-flop in SAR logic and high efficiency wide range delay element extend the flexibility of speed and resolution tradeoff. The ADC fabricated in 40 nm CMOS process covers 4–10 bit resolution and 0.4–1 V power supply range. The ADC achieved 49.8 dB SNDR and the peak FoM of 3.4 fJ/conv. with 160 kS/sec at 0.4 V single power supply voltage. At 10 bit mode and 1 V operation, up to 10 MS/s, the FoM is below 10 fJ/conv. while keeping ENOB of 8.7 bit.

The performance of successive approximation register (SAR) analog-to-digital converter (ADC) is well balanced between power and speed compare to the conventional flash or pipeline architecture. The nonlinearities suffer from the CDAC mismatch and comparator offset degrades SAR ADC performance in terms of DNL and INL. An on chip histogram-based digitally assisted background calibration technique is proposed to cancel and relax the aforesaid nonlinearities. The calibration is performed using the input signal, watching the digital codes in the specified vicinity of the decision boundaries, and feeding back to control the compensation capacitor periodically. The calibration does not require special calibration signal or additional analog hardware which is simple and amenable to hardware or software implementations. A 9-bit SAR ADC with split CDAC has been implemented in a 65 nm CMOS technology and it achieves a peak SNDR of 50.81 dB and consumes 1.34 mW from a 1.2-V supply. +0.4/-0.4 LSB DNL and +0.5/-0.7 LSB INL are achieved after calibration. The ADC has input capacitance of 180 fF and occupies an area of 0.10.13 mm2.

A 200 kS/s 10-bit successive approximation (SA) analog-to-digital converter (ADC) with a rail-to-rail input signal is proposed for acquiring biosignals such as EEG and MEG signals. A split-capacitor-based digital-to-analog converter (SC-DAC) is used to reduce the power consumption and chip area. The SC-DAC's linearity is improved by using dummy capacitors and a small bootstrapped analog switch with a constant on-resistance, without increasing its area. A time-domain comparator with a replica circuit for clock feed-through noise compensation is designed by using a highly differential digital architecture involving a small area. Its area is about 50% less than that of a conventional time-domain comparator. The proposed SA ADC is implemented by using a 0.18-µm 1-poly 6-metal CMOS process with a 1 V supply. The measured DNL and INL are +0.44/-0.4 LSB and +0.71/-0.62 LSB, respectively. The SNDR is 55.43 dB for a 99.01 kHz analog input signal at a sampling rate of 200 kS/s. The power consumption and core area are 5 µW and 0.126 mm2, respectively. The FoM is 47 fJ/conversion-step.

In this paper, two techniques for implementing a low-power pipelined analog-to-digital converter (ADC) are proposed. First, the time-interleaved correlated double sampling (CDS) technique is proposed to compensate the finite gain error of operational amplifiers in switched-capacitor circuits without a half-rate front-end sample-and-hold amplifier (SHA). Therefore, low-gain amplifiers and the SHA-less architecture can be used to effectively reduce power consumption of a pipelined ADC. Second, the back-end pipelined stages of a pipelined ADC are implemented using a low-power time-interleaved successive approximation (SA) ADC rather than operational amplifiers to further reduce the power consumption of the proposed pipelined ADC. A 9-bit, 100-MS/s hybrid pipelined-SA ADC is implemented in the TSMC 0.13 µm triple-well 1P8M CMOS process. The ADC achieves a spurious free dynamic range (SFDR) of 62.15 dB and a signal-to-noise distortion ratio (SNDR) of 50.85-dB for 2-MHz input frequency at a 100-MS/s sampling rate. The power consumption is 21.2 mW from a 1.2 V supply. The core area of the ADC is 1.6 mm2.

A 9-bit 100-MS/s successive approximation register (SAR) ADC with low power and small area has been implemented in 65-nm CMOS technology. A tri-level charge redistribution technique is proposed to reduce DAC switching energy and settling time. By connecting bottom plates of differential capacitor arrays for charge sharing, extra reference voltage is avoided. Two reference voltages charging and discharging the capacitors are chosen to be supply voltage and ground in order to save energy and achieve a rail-to-rail input range. Split capacitor arrays with mismatch calibration are implemented for small area and small input capacitance without linearity degradation. The ADC achieves a peak SNDR of 53.1 dB and consumes 1.46 mW from a 1.2-V supply, resulting in a figure of merit (FOM) of 39 fJ/conversion-step. The total active area is 0.012 mm2 and the input capacitance is 180 fF.

We present self-calibration techniques for an interleaved SAR (Successive Approximation Register) ADC. The calibration technique is based on hardware corrections for linearity of single stage, gain error and mismatch errors of parallel ADCs. The 4-interleaved 11-bit ADC has been fabricated in a 0.18-µm CMOS process. Using the calibrations, measurement and calculation results show that the differences of ramp characteristic among the 4-interleaving ADC can be decresased to under 0.63 LSB.

Charge redistribution based successive approximation (SA) analog-to-digital converter (ADC) has the advantage of power efficiency. Split capacitor digital-to-analog converter (CDAC) technique implements two sets of binary-weighted capacitor arrays connected by a bridge capacitor so as to reduce both input load capacitance and area. However, capacitor mismatches degrade ADC performance in terms of DNL and INL. In this work, a split CDAC mismatch calibration method is proposed. A bridge capacitor larger than conventional design is implemented so that a tunable capacitor can be added in parallel with the lower-weight capacitor array to compensate for mismatches. To guarantee correct CDAC calibration, comparator offset is cancelled using a digital timing control charge compensation technique. To further reduce the input load capacitance, an extra unit capacitor is added to the higher-weight capacitor array. Instead of the lower-weight capacitor array, the extra unit capacitor and the higher-weight capacitor array sample analog input signal. An 8-bit SA ADC with 4-bit + 4-bit split CDAC has been implemented in a 65 nm CMOS process. The ADC has an input capacitance of 180 fF and occupies an active area of 0.03 mm2. Measured results of +0.2/-0.3LSB DNL and +0.3/-0.3LSB INL have been achieved after calibration.

We present a 10-bit 1-MS/s successive approximation analog-to-digital converter core including a charge redistribution digital-to-analog converter and a comparator. A new linearity calibration technique enables use of a nearly minimum capacitor limited by kT/C noise. The ADC core without digital control blocks has been fabricated in a 0.18-µm CMOS process and consumes 118 µW at 1.8 V power supply. Also, the active area of ADC core is realized to be 0.027 mm2. The calibration improves the SNDR by 13.4 dB and the SFDR by 21.0 dB. The measured SNDR and SFDR at 1 kHz input are 55.2 dB and 73.2 dB respectively.

Sinusoidal representation has been widely applied to speech modification, low bit rate speech and audio coding. Usually, speech signal is analyzed and synthesized using the overlap-add algorithm or the peak-picking algorithm. But the overlap-add algorithm is well known for high computational complexity and the peak-picking algorithm cannot track the transient and syllabic variation well. In this letter, both algorithms are applied to speech analysis/synthesis. Peaks are picked in the curve of power spectral density for speech signal; the frequencies corresponding to these peaks are arranged according to the descending orders of their corresponding power spectral densities. These frequencies are regarded as the candidate frequencies to determine the corresponding amplitudes and initial phases according to the least mean square error criterion. The summation of the extracted sinusoidal components is used to successively approach the original speech signal. The results show that the proposed algorithm can track the transient and syllabic variation and can attain the good synthesized speech signal with low computational complexity.

In this paper, we analyze wavelet-based coding in a rate-distortion (R-D) sense by using Laplacian and Markov models and verify the results with the performance of the typical embedded coders, EZW and SPIHT, and the non-embedded coder implemented here. Laplacian represents the probability density function (pdf) of wavelet coefficients and Markov statistical dependency within and among subbands. The models allow us to easily understand the behavior of a thresholding and quantization part and a lossless coding part and associate the embedded coders with the nonembedded coder, which is the point the paper approaches. The analytic results are shown to coincide well with the actual coding results.